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Effect of Duty Cycle on Properties of Pulse-electro-deposited SnS:Ag Thin Films 预览
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《半导体光子学与技术:英文版》 CAS 2010年第4期132-136,145共6页
SnS∶Ag thin films were deposited on ITO glasses by pulse electro-deposition. By studying the effect of duty cycle on the properties of SnS∶Ag thin films, the optimum off-time(toff) is obtained to be 5 s, namely, th... SnS∶Ag thin films were deposited on ITO glasses by pulse electro-deposition. By studying the effect of duty cycle on the properties of SnS∶Ag thin films, the optimum off-time(toff) is obtained to be 5 s, namely, the optimal duty cycle is about 67%. The primary phase of SnS∶Ag films deposited on optimum parameters condition is SnS compound with good crystallization, and the films prefer to grow towards (111) plane. The films are dense, smooth and uniform with good microstructure, and the grains in the films are densely packed together, and their direct bandgap is about 1.40 eV. In addition, the bandgap of the films first rises and then drops with the increase of the duty cycle. 展开更多
关键词 DUTY cycle PULSE ELECTRODEPOSITION SnSAg thin films optical properties
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脉冲法电沉积SnS:Ag薄膜
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作者 杨永丽 程树英 《半导体学报:英文版》 EI CAS CSCD 北大核心 2008年第12期2322-2325,共4页
用脉冲电沉积技术,在ITO玻璃基片上制备了SnS:Ag薄膜,用X射线衍射(XRD)和原子力显微镜(AFM)观察了薄膜的物相结构和表面形貌,结果表明SnS:Ag薄膜出现了新物相Ag8SnS6,结晶度好,颗粒度大.用光电流测试研究了其导电性能,表明... 用脉冲电沉积技术,在ITO玻璃基片上制备了SnS:Ag薄膜,用X射线衍射(XRD)和原子力显微镜(AFM)观察了薄膜的物相结构和表面形貌,结果表明SnS:Ag薄膜出现了新物相Ag8SnS6,结晶度好,颗粒度大.用光电流测试研究了其导电性能,表明SnS:Ag薄膜是P型半导体材料.霍尔测量表明掺杂后载流子浓度增大,电阻率降低. 展开更多
关键词 脉冲电沉积 薄膜 光电性能 半导体材料
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